Duo, Yingshi;
              
      
            
                Coop, Joshua;
              
      
            
                Farrer, Ian;
              
      
            
                Ritchie, David A;
              
      
            
                Kumar, Sanjeev;
              
      
        
        
  
(2026)
  Gate-Controlled Interaction Effects in 1D Quantum Channels.
    
    
      In: 
      2025 20th Nanotechnology Materials and Devices Conference (NMDC).
      
      
    
 IEEE
   (In press).
  
      
    
  
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Abstract
We present experimental results of electron transport in one-dimensional (1D) quantum channels created electrostatically with a triple-gate setup on GaAs/AlGaAs heterostructures. In this configuration, two gates determine the confinement potential, while the third gate adjusts the carrier density within the 1D channel. While maintaining a shallower confinement and decreasing the 1D carrier density, we observe interactions between the ground and first excited states, leading to an anticrossing. These states rely on the 1D carrier density, the decrease in confinement potential, and the effects of Coulomb interaction. Our results suggest that fine-tuning the triple-gate geometry may reveal complex phases in interacting 1D quantum systems.
| Type: | Proceedings paper | 
|---|---|
| Title: | Gate-Controlled Interaction Effects in 1D Quantum Channels | 
| Event: | 20th Nanotechnology Materials and Devices Conference (NMDC) | 
| Location: | https://2025.ieeenmdc.org/ | 
| Dates: | 9 Oct 2025 - 11 Oct 2025 | 
| Open access status: | An open access version is available from UCL Discovery | 
| Publisher version: | https://2025.ieeenmdc.org/ | 
| Language: | English | 
| Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions. | 
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng  | 
        
| URI: | https://discovery.ucl.ac.uk/id/eprint/10216215 | 
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