Zhang, Xin;
Minghao, Li;
Ghoreishizadeh, Seyedeh;
(2025)
A Failure Detection Technique for Au-Plated CMOS Microelectrode Arrays.
In:
(Proceedings) IEEE ISCAS 2025.
(In press).
Preview |
Text
Template(2).pdf - Accepted Version Download (3MB) | Preview |
Abstract
A method for the detection of failure in goldplated microelectrodes is presented. Three main failure mechanisms – layer detachment, biofouling and halide-mediated passivation (HMP) – were induced on the microelectrodes, leading to electrode failure. Sequential admittance and sensitivity measurements were carried out on gold-plated microelectrodes on printed circuit boards (PCBs) and CMOS chips to develop and train the classifier. A two-step classifier is proposed that relies only on measuring the admittance magnitude (|Y |) at three specific frequencies within 0.6 - 800 Hz. The classifier achieves 88% accuracy on PCB microelectrodes and 92% accuracy on CMOS microelectrodes.
| Type: | Proceedings paper |
|---|---|
| Title: | A Failure Detection Technique for Au-Plated CMOS Microelectrode Arrays |
| Event: | IEEE ISCAS 2025 |
| Location: | London |
| Dates: | 26 May 2025 - 28 May 2025 |
| Open access status: | An open access version is available from UCL Discovery |
| Publisher version: | https://ieeexplore.ieee.org/Xplore/home.jsp |
| Language: | English |
| Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions. |
| Keywords: | CMOS microelectrode, electrochemical impedance spectroscopy, fault detection |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10209162 |
Archive Staff Only
 |
View Item |
