Mannion, Daniel J;
Ng, Wing H;
Mehonic, Adnan;
Kenyon, Anthony J;
(2024)
A Compact SPICE Model for Current Transients within the Subthreshold Regime of Memristors.
In:
Proceedings of the IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) 2023.
(pp. pp. 977-982).
Institute of Electrical and Electronics Engineers (IEEE)
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Abstract
In memristors and resistance switching devices, there is a region prior to switching which exhibits current transients with potentially useful dynamics. We refer to this region as the subthreshold region owing to it occurring prior to any switching threshold. These transients exhibit a characteristic peaked response with a fast rise in current followed by a slower decay. This behaviour has previously been used to quantify the mobilities of defects drifting within the active layer of the devices, but it has also been used in neuromorphic circuits to carry out edge detection, to implement homeostasis within artificial synapses and could have uses in replicating eligibility traces. We present an empirical SPICE model to reproduce these transients within circuit simulators. The model is compared with experimental datasets for a range of applied voltages and we present experimentally verified parameters for readers to use within their own simulations.
Type: | Proceedings paper |
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Title: | A Compact SPICE Model for Current Transients within the Subthreshold Regime of Memristors |
Event: | 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) |
Location: | Milano, Italy |
Dates: | 25th-27th October 2023 |
ISBN-13: | 979-8-3503-0080-2 |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1109/MetroXRAINE58569.2023.10405754 |
Publisher version: | https://doi.org/10.1109/MetroXRAINE58569.2023.1040... |
Language: | English |
Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher's terms and conditions. |
Keywords: | memristor, ReRAM, SPICE, modelling subthreshold |
UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
URI: | https://discovery.ucl.ac.uk/id/eprint/10189965 |
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