Wolf, Andreas;
Akstaller, Bernhard;
Cipiccia, Silvia;
Flenner, Silja;
Hagemann, Johannes;
Ludwig, Veronika;
Meyer, Pascal;
... Funk, Stefan; + view all
(2022)
Single-exposure X-ray phase imaging microscopy with a grating interferometer.
Journal of Synchrotron Radiation
, 29
(Pt 3)
pp. 794-806.
10.1107/S160057752200193X.
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Abstract
The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X-ray free-electron lasers where intrinsic pulse-to-pulse fluctuations pose a major challenge. In this work, the single-exposure phase imaging capabilities of grating interferometry are characterized by an implementation at the I13-1 beamline of Diamond Light Source (Oxfordshire, UK). For comparison purposes, propagation-based phase contrast imaging was also performed at the same instrument. The characterization is carried out in terms of the quantitativeness and the contrast-to-noise ratio of the phase reconstructions as well as via the achievable spatial resolution. By using a statistical image reconstruction scheme, previous limitations of grating interferometry regarding the spatial resolution can be mitigated as well as the experimental applicability of the technique.
| Type: | Article |
|---|---|
| Title: | Single-exposure X-ray phase imaging microscopy with a grating interferometer |
| Location: | United States |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1107/S160057752200193X |
| Publisher version: | https://doi.org/10.1107/S160057752200193X |
| Language: | English |
| Additional information: | This version is the version of record. For information on re-use, please refer to the publisher’s terms and conditions. |
| Keywords: | Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Optics, Physics, Applied, Physics, phase contrast X-ray imaging, X-ray microscopy, grating interferometry, phase retrieval, FREE-ELECTRON LASER, WAVE-FRONT, CONTRAST, RESOLUTION, TOMOGRAPHY, TOPOGRAPHY |
| UCL classification: | UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng UCL > Provost and Vice Provost Offices > UCL BEAMS UCL |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10151740 |
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