Buchanan, I;
Astolfo, A;
Endrizzi, M;
Bate, D;
Olivo, A;
(2022)
Reliable material characterisation at low x-ray energy through the phase-attenuation duality.
Applied Physics Letters
, 120
(12)
, Article 124102. 10.1063/5.0085506.
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Abstract
We present a comparison of between two polychromatic X-ray imaging techniques used to characterise materials: dual energy (DE) attenuation and phase-attenuation (PA), the latter being implemented via a scanning-based Edge Illumination system. The system-independent method to extract electron density and effective atomic number developed by S.G. Azevedo et al IEEE Transactions on nuclear science, Vol. 63, 341 (2016) - SIRZ - is employed for the analysis of planar images, with the same methodology being used for both approaches. We show PA to be more reliable at low energy X-ray spectra (40 kVp), where conventional DE breaks down due to insufficient separation of the energies used in measurements, and to produce results comparable with “standard” DE implemented at high energy (120 kVp), therefore offering a valuable alternative in applications where the use of high x-ray energy is impractical.
| Type: | Article |
|---|---|
| Title: | Reliable material characterisation at low x-ray energy through the phase-attenuation duality |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1063/5.0085506 |
| Publisher version: | https://doi.org/10.1063/5.0085506 |
| Language: | English |
| Additional information: | Copyright 2022 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
| UCL classification: | UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng UCL > Provost and Vice Provost Offices > UCL BEAMS UCL |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10144859 |
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