Mannion, DJ;
Ng, WH;
Mehonic, A;
Kenyon, A;
(2021)
Improving the accuracy of defect mobilities and observing interface effects of resistive switching memories using the current transient phenomenon.
Presented at: Materials Challenges for Memory, Virtual conference.
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| Type: | Poster |
|---|---|
| Title: | Improving the accuracy of defect mobilities and observing interface effects of resistive switching memories using the current transient phenomenon |
| Event: | Materials Challenges for Memory |
| Location: | Virtual conference |
| Dates: | 11 - 13 April 2021 |
| Open access status: | An open access version is available from UCL Discovery |
| Publisher version: | https://publishing.aip.org/resources/horizons-conf... |
| Language: | English |
| Keywords: | vacancy, mobility, memristor, rram |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Engineering Science Faculty Office |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10125847 |
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