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Number of items: 13.
Article
Bustamante, José;
Miyahara, Yoichi;
Fairgrieve-Park, Logan;
Spruce, Kieran;
See, Patrick;
Curson, Neil;
Stock, Taylor JZ;
(2024)
Needle in a haystack: Efficiently finding atomically defined quantum dots for electrostatic force microscopy.
Review of Scientific Instruments
, 95
(8)
, Article 083709. 10.1063/5.0208571.
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Chapman, Gemma;
Votsi, Haris;
Stock, Taylor JZ;
Clowes, Steven K;
Curson, Neil J;
Aaen, Peter H;
Murdin, Ben N;
(2022)
Microwave Properties of 2D CMOS Compatible Co-Planar Waveguides Made from Phosphorus Dopant Monolayers in Silicon.
Advanced Electronic Materials
, 8
(5)
, Article 2100989. 10.1002/aelm.202100989.
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D'Anna, Nicolò;
Ferreira Sanchez, Dario;
Matmon, Guy;
Bragg, Jamie;
Constantinou, Procopios C;
Stock, Taylor JZ;
Fearn, Sarah;
... Aeppli, Gabriel; + view all
(2023)
Non‐Destructive X‐Ray Imaging of Patterned Delta‐Layer Devices in Silicon.
Advanced Electronic Materials
10.1002/aelm.202201212.
(In press).
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Gramse, G;
Koelker, A;
Skeren, T;
Stock, TJZ;
Aeppli, G;
Kienberger, F;
Fuhrer, A;
(2020)
Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p–n junctions.
Nature Electronics
, 3
pp. 531-538.
10.1038/s41928-020-0450-8.
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Gramse, G;
Kölker, A;
Lim, T;
Stock, TJZ;
Solanki, H;
Schofield, SR;
Brinciotti, E;
... Curson, NJ; + view all
(2017)
Nondestructive imaging of atomically thin nanostructures buried in silicon.
Science Advances
, 3
(6)
e1602586-e1602586.
10.1126/sciadv.1602586.
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Hofmann, EVS;
Scalise, E;
Montalenti, F;
Stock, TJZ;
Schofield, SR;
Capellini, G;
Miglio, L;
... Klesse, WM; + view all
(2021)
The formation of a Sn monolayer on Ge(1 0 0) studied at the atomic scale.
Applied Surface Science
, 561
, Article 149961. 10.1016/j.apsusc.2021.149961.
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Kölker, Alexander;
Gramse, Georg;
Stock, Taylor JZ;
Aeppli, Gabriel;
Curson, Neil J;
(2022)
In operando charge transport imaging of atomically thin dopant nanostructures in silicon.
Nanoscale
, 14
(17)
pp. 6437-6448.
10.1039/d1nr08381c.
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Lundgren, Eric AS;
Byron, Carly;
Constantinou, Procopios;
Stock, Taylor JZ;
Curson, Neil J;
Thomsen, Lars;
Warschkow, Oliver;
... Schofield, Steven R; + view all
(2023)
Adsorption and Thermal Decomposition of Triphenyl Bismuth on Silicon (001).
The Journal of Physical Chemistry C
, 127
(33)
16433 -16441.
10.1021/acs.jpcc.3c03916.
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Stock, Taylor JZ;
Warschkow, Oliver;
Constantinou, Procopios C;
Bowler, David R;
Schofield, Steven R;
Curson, Neil J;
(2024)
Single‐Atom Control of Arsenic Incorporation in Silicon for High‐Yield Artificial Lattice Fabrication.
Advanced Materials
, 36
(24)
, Article 2312282. 10.1002/adma.202312282.
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Stock, TJZ;
Warschkow, O;
Constantinou, PC;
Li, J;
Fearn, S;
Crane, E;
Hofmann, EVS;
... Curson, NJ; + view all
(2020)
Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy.
ACS Nano
, 14
(3)
pp. 3316-3327.
10.1021/acsnano.9b08943.
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Strocov, VN;
Lev, LL;
Alarab, F;
Constantinou, P;
Wang, X;
Schmitt, T;
Stock, TJZ;
... Minár, J; + view all
(2023)
High-energy photoemission final states beyond the free-electron approximation.
Nature Communications
, 14
(1)
, Article 4827. 10.1038/s41467-023-40432-5.
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Tseng, Li-Ting;
Karadan, Prajith;
Kazazis, Dimitrios;
Constantinou, Procopios C;
Stock, Taylor JZ;
Curson, Neil J;
Schofield, Steven R;
... Ekinci, Yasin; + view all
(2023)
Resistless EUV lithography: Photon-induced oxide patterning on silicon.
Science Advances
, 9
(16)
, Article eadf5997. 10.1126/sciadv.adf5997.
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Proceedings paper
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Crane, EM;
Kolker, A;
Stock, TZ;
Stavrias, N;
Saeedi, K;
Van Loon, MAW;
Murdin, BN;
(2018)
Hydrogen resist lithography and electron beam lithography for fabricating silicon targets for studying donor orbital states.
In:
Journal of Physics: Conference Series.
IOP
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