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Characterising thermal runaway within lithium-ion cells by inducing and monitoring internal short circuits

Finegan, DP; Darcy, E; Keyser, M; Tjaden, B; Heenan, TMM; Jervis, R; Bailey, JJ; ... Shearing, PR; + view all (2017) Characterising thermal runaway within lithium-ion cells by inducing and monitoring internal short circuits. Energy & Environmental Science , 10 (6) pp. 1377-1388. 10.1039/c7ee00385d. Green open access

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Abstract

Lithium-ion batteries are being used in increasingly demanding applications where safety and reliability are of utmost importance. Thermal runaway presents the greatest safety hazard, and needs to be fully understood in order to progress towards safer cell and battery designs. Here, we demonstrate the application of an internal short circuiting device for controlled, on-demand, initiation of thermal runaway. Through its use, the location and timing of thermal runaway initiation is pre-determined, allowing analysis of the nucleation and propagation of failure within 18 650 cells through the use of high-speed X-ray imaging at 2000 frames per second. The cause of unfavourable occurrences such as sidewall rupture, cell bursting, and cell-to-cell propagation within modules is elucidated, and steps towards improved safety of 18 650 cells and batteries are discussed.

Type: Article
Title: Characterising thermal runaway within lithium-ion cells by inducing and monitoring internal short circuits
Open access status: An open access version is available from UCL Discovery
DOI: 10.1039/c7ee00385d
Publisher version: http://doi.org/10.1039/c7ee00385d
Language: English
Additional information: This article is published as open access under CC BY licence
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Chemical Engineering
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/1564723
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