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Integrating Sphere Microscopy for Direct Absorption Measurements of Single Nanostructures

Mann, SA; Sciacca, B; Zhang, Y; Wang, J; Kontoleta, E; Liu, H; Garnettt, EC; (2017) Integrating Sphere Microscopy for Direct Absorption Measurements of Single Nanostructures. ACS Nano , 11 (2) pp. 1412-1418. 10.1021/acsnano.6b06534. Green open access

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Abstract

Nanoscale materials are promising for optoelectronic devices because their physical dimensions are on the order of the wavelength of light. This leads to a variety of complex optical phenomena that, for instance, enhance absorption and emission. However, quantifying the performance of these nanoscale devices frequently requires measuring absolute absorption at the nanoscale, and remarkably, there is no general method capable of doing so directly. Here, we present such a method based on an integrating sphere but modified to achieve submicron spatial resolution. We explore the limits of this technique by using it to measure spatial and spectral absorptance profiles on a wide variety of nanoscale systems, including different combinations of weakly and strongly absorbing and scattering nanomaterials (Si and GaAs nanowires, Au nanoparticles). This measurement technique provides quantitative information about local optical properties that are crucial for improving any optoelectronic device with nanoscale dimensions or nanoscale surface texturing.

Type: Article
Title: Integrating Sphere Microscopy for Direct Absorption Measurements of Single Nanostructures
Open access status: An open access version is available from UCL Discovery
DOI: 10.1021/acsnano.6b06534
Publisher version: http://doi.org/10.1021/acsnano.6b06534
Language: English
Additional information: Copyright © 2017 American Chemical Society. All rights reserved. This is an open access article published under a Creative Commons Non-Commercial No Derivative Works (CC-BY-NC-ND) Attribution License, which permits copying and redistribution of the article, and creation of adaptations, all for non-commercial purposes.
Keywords: Absorption spectroscopy; Mie resonances; nanoparticles; nanowires; plasmon resonance; quantitative spectroscopy
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/1546223
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