Chryssou, CE;
Kenyon, AJ;
Iwayama, TS;
Pitt, CW;
Hole, DE;
(1999)
Evidence of energy coupling between Si nanocrystals and Er3+ in ion-implanted silica thin films.
Applied Physics Letters
, 75
(14)
2011 - 2013.
10.1063/1.124899.
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Abstract
Silica thin films containing Si nanocrystals and Er3+ were prepared by ion implantation. Excess Si concentrations ranged from 5% to 15%; Er3+ concentration for all samples was 0.5%. Samples exhibited photoluminescence at 742 nm (attributed to Si nanocrystals), 654 nm (defects due to Er3+ implantation), and at 1.53 μm (intra-4f transitions). Photoluminescence intensity at 1.53 μm increased ten times by incorporating Si nanocrystals. Strong, broad photoluminescence at 1.53 μm was observed for λPump away from Er3+ absorption peaks, implying energy transfer from Si nanocrystals. Erbium fluorescence lifetime decreased from 4 ms to 1 ms when excess Si increased from 5% to 15%, suggesting that at high Si content Er3+ ions are primarily situated inside Si nanocrystals.
| Type: | Article |
|---|---|
| Title: | Evidence of energy coupling between Si nanocrystals and Er3+ in ion-implanted silica thin films |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1063/1.124899 |
| Publisher version: | http://dx.doi.org/10.1063/1.124899 |
| Language: | English |
| Additional information: | Copyright 1999 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Chryssou, CE and Kenyon, AJ and Iwayama, TS and Pitt, CW and Hole, DE (1999) Evidence of energy coupling between Si nanocrystals and Er3+ in ion-implanted silica thin films. Applied Physics Letters , 75 (14) 2011 – 2013 and may be found at http://link.aip.org/link/?apl/75/02011 |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/149387 |
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