Darrer, BJ;
Watson, JC;
Bartlett, PA;
Renzoni, F;
(2015)
Electromagnetic imaging through thick metallic enclosures.
AIP Advances
, 5
(8)
10.1063/1.4928864.
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Abstract
The ability to image through metallic enclosures is an important goal of any scanning technology for security applications. Previous work demonstrated the penetrating power of electromagnetic imaging through thin metallic enclosures, thus validating the technique for security applications such as cargo screening. In this work we study the limits of electromagnetic imaging through metallic enclosures, considering the performance of the imaging for different thicknesses of the enclosure. Our results show, that our system can image a Copper disk, even when enclosed within a 20 mm thick Aluminum box. The potential for imaging through enclosures of other materials, such as Lead, Copper, and Iron, is discussed.
| Type: | Article |
|---|---|
| Title: | Electromagnetic imaging through thick metallic enclosures |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1063/1.4928864 |
| Publisher version: | http://dx.doi.org/ 10.1063/1.4928864 |
| Language: | English |
| Additional information: | Copyright © Author(s) 2015 Licensed under a Creative Commons Attribution 3.0 Unported License. (https://creativecommons.org/licenses/by/3.0/) |
| Keywords: | Magnetic Induction Tomography |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Physics and Astronomy |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1480833 |
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