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End facet roughness and coupling loss

Selviah, DR; Baghsiahi, H; Wang, K; (2014) End facet roughness and coupling loss. Presented at: International Electrotechnical Commission IEC Annual International Conference, IEC SC86B JWG9, Charlotte USA. Green open access

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Type: Conference item (Presentation)
Title: End facet roughness and coupling loss
Event: International Electrotechnical Commission IEC Annual International Conference, IEC SC86B JWG9
Location: Charlotte USA
Dates: 2013-10-29 - 2013-10-29
Open access status: An open access version is available from UCL Discovery
Language: English
UCL classification: UCL
UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
URI: https://discovery.ucl.ac.uk/id/eprint/1434899
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