Selviah, DR;
Baghsiahi, H;
Wang, K;
(2014)
End facet roughness and coupling loss.
Presented at: International Electrotechnical Commission IEC Annual International Conference, IEC SC86B JWG9, Charlotte USA.
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| Type: | Conference item (Presentation) |
|---|---|
| Title: | End facet roughness and coupling loss |
| Event: | International Electrotechnical Commission IEC Annual International Conference, IEC SC86B JWG9 |
| Location: | Charlotte USA |
| Dates: | 2013-10-29 - 2013-10-29 |
| Open access status: | An open access version is available from UCL Discovery |
| Language: | English |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1434899 |
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