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Application of Noise2Inverse and adaptation (Noise2Phase) to single-mask x-ray phase contrast micro-computed tomography

Shah, Khushal; Lioliou, Grammatiki; Chen, Dai; Denker, Alexander; Munro, Peter; Endrizzi, Marco; Astolfo, Alberto; ... Hagen, Charlotte K; + view all (2025) Application of Noise2Inverse and adaptation (Noise2Phase) to single-mask x-ray phase contrast micro-computed tomography. Journal of Microscopy , Article jmi.70056. 10.1111/jmi.70056. Green open access

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Abstract

X-ray phase contrast imaging (XPCI), when implemented in micro-computed tomography (micro-CT) mode, offers high-contrast 3D imaging of weakly-attenuating material samples. In the so-called single-mask edge illumination approach, a mask with periodically spaced transmitting apertures is used to split the x-ray beam into narrow beamlets; when the beamlets are aligned with the boundaries (‘edges') between detector pixels, their refraction-induced deviation can be detected and used to form images. A shortcoming is that the mask reduces the x-ray flux, necessitating longer exposures and therefore longer acquisition times. We show that the demand on exposure time can be relaxed by integrating the deep learning–based denoising technique Noise2Inverse into the image processing workflow. The applicability of Noise2Inverse to single-mask edge illumination XPCI micro-CT is demonstrated, and its performance at severe noise levels is explored. Taking advantage of the distinct imaging system characteristics, we also propose an adaptation of Noise2Inverse, called Noise2Phase, which does not rely on splitting the CT dataset by projections.

Type: Article
Title: Application of Noise2Inverse and adaptation (Noise2Phase) to single-mask x-ray phase contrast micro-computed tomography
Location: England
Open access status: An open access version is available from UCL Discovery
DOI: 10.1111/jmi.70056
Publisher version: https://doi.org/10.1111/jmi.70056
Language: English
Additional information: © 2025 The Author(s). Journal of Microscopy published by John Wiley & Sons Ltd on behalf of Royal Microscopical Society. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
Keywords: Science & Technology, Technology, Microscopy, deep learning, denoising, micro-CT, noise2inverse, x-ray phase contrast, IMAGE
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/10219707
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