Odedeyi, T;
Darwazeh, I;
(2023)
New Insights on Application of Return Loss Measurement for Starch Content Estimation in Cassava.
In:
2023 IEEE AFRICON.
IEEE: Nairobi, Kenya.
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Abstract
This research explores the use of radio frequency (RF) return loss measurement to characterize cassava quality and estimate the starch content of cassava roots, with new equivalent circuit models presented. While pure starch is non-conductive, the content of charged ions in the raw composite cassava flour provides a potential marker for estimating the starch content of cassava, which is important for the design of quality measurement devices based on the return loss method. The study also raises questions for further exploration, such as understanding the pattern of distribution of the electrolytic components in a fresh root and exploring the relationships between these ions and other properties of cassava. Overall, these new findings offer new directions for research and development in the field of food quality assessment.
| Type: | Proceedings paper |
|---|---|
| Title: | New Insights on Application of Return Loss Measurement for Starch Content Estimation in Cassava |
| Event: | 2023 IEEE AFRICON |
| Dates: | 20 Sep 2023 - 22 Sep 2023 |
| ISBN-13: | 9798350336214 |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1109/AFRICON55910.2023.10293499 |
| Publisher version: | http://dx.doi.org/10.1109/africon55910.2023.102934... |
| Language: | English |
| Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions. |
| Keywords: | Radio frequency, Electric variables measurement, Ions, Loss measurement, Quality assessment, Integrated circuit modeling, Potassium |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10184982 |
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