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Photoconductive Metasurfaces for Near-Field Terahertz Sources and Detectors

Hale, L; Jung, H; Seddon, J; Sarma, R; Gennaro, SD; Briscoe, J; Harris, CT; ... Mitrofanov, O; + view all (2023) Photoconductive Metasurfaces for Near-Field Terahertz Sources and Detectors. In: Razeghi, Manijeh and Jarrahi, Mona, (eds.) Proceedings of SPIE - The International Society for Optical Engineering. SPIE Green open access

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Abstract

Aperture near-field microscopy and spectroscopy (a-SNOM) enables the direct experimental investigation of subwavelength-sized resonators by sampling highly confined local evanescent fields on the sample surface. Despite its success, the versatility and applicability of a-SNOM is limited by the sensitivity of the aperture probe, as well as the power and versatility of THz sources used to excite samples. Recently, perfectly absorbing photoconductive metasurfaces have been integrated into THz photoconductive antenna detectors, enhancing their efficiency and enabling high signal-to-noise ratio THz detection at significantly reduced optical pump powers. Here, we discuss how this technology can be applied to aperture near-field probes to improve both the sensitivity and potentially spatial resolution of a-SNOM systems. In addition, we explore the application of photoconductive metasurfaces also as near-field THz sources, providing the possibility of tailoring the beam profile, polarity and phase of THz excitation. Photoconductive metasurfaces therefore have the potential to broaden the application scope of aperture near-field microscopy to samples and material systems which currently require improved spatial resolution, signal-to-noise ratio, or more complex excitation conditions.

Type: Proceedings paper
Title: Photoconductive Metasurfaces for Near-Field Terahertz Sources and Detectors
Event: SPIE Optical Engineering + Applications, 2023
Dates: 20 Aug 2023 - 25 Aug 2023
ISBN-13: 9781510665804
Open access status: An open access version is available from UCL Discovery
DOI: 10.1117/12.2681721
Publisher version: http://doi.org/10.1117/12.2681721
Language: English
Additional information: This version is the version of record. For information on re-use, please refer to the publisher’s terms and conditions.
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/10184943
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