Buchanan, Ian;
Cipiccia, Silvia;
Peiffer, Carlo;
Navarrete-León, Carlos;
Astolfo, Alberto;
Partridge, Tom;
Esposito, Michela;
... Olivo, Alessandro; + view all
(2023)
Direct x-ray scattering signal measurements in edge-illumination/beam-tracking imaging and their interplay with the variance of the refraction signals.
Applied Physics Reviews
, 10
, Article 041406. 10.1063/5.0168049.
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Abstract
X-ray dark-field or ultra-small angle scatter imaging has become increasingly important since the introduction of phase-based x-ray imaging and is having transformative impact in fields such as in vivo lung imaging and explosives detection. Here, we show that dark-field images acquired with the edge-illumination method (either in its traditional double mask or simplified single mask implementation) provide a direct measurement of the scattering function, which is unaffected by system-specific parameters such as the autocorrelation length. We show that this is a consequence both of the specific measurement setup and of the mathematical approach followed to retrieve the dark-field images. We show agreement with theoretical models for datasets acquired both with synchrotron and laboratory x-ray sources. We also introduce a new contrast mechanism, the variance of refraction, which is extracted from the same dataset and provides a direct link with the size of the scattering centers. We show that this can also be described by the same theoretical models. We study the behavior of both signals vs key parameters such as x-ray energy and scatterer radius. We find this allows quantitative and direct scattering measurements during imaging, with implications in all fields where dark-field imaging is used.
| Type: | Article |
|---|---|
| Title: | Direct x-ray scattering signal measurements in edge-illumination/beam-tracking imaging and their interplay with the variance of the refraction signals |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1063/5.0168049 |
| Publisher version: | https://doi.org/10.1063/5.0168049 |
| Language: | English |
| Additional information: | © 2023 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
| Keywords: | Dark field microscopy, X-ray scattering, Interferometry, Physical optics, X-ray imaging, Synchrotrons, Scattering theory |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10178612 |
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