Lv, X;
Zhang, Y;
Shi, Q;
Temiz, M;
El-Makadema, A;
(2021)
Examining Food Quality via RFID Tag Array.
In:
2021 International Conference on Microwave and Millimeter Wave Technology (ICMMT).
IEEE: Nanjing, China.
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Abstract
Radio-frequency identification (RFID) tags are widely used in the food supply chain where they can be used to hold identification data of tagged objects. They can also be used to provide information related to the quality and safety of the tagged object. This can be achieved by analyzing the RF signals emitted by the tag which couples with the tagged objects, and hence can be used to acquire useful information related to the safety and quality of that object. This paper investigates the correlation between the radiated signals from the tags and the quality characteristics of the tagged objects. It focuses on analyzing the mutual coupling between the tags in an array, in particular, of orthogonal polarization configuration, which shows that more information can be extracted by an array of tags compared to the use of a single RFID tag emitter.
Type: | Proceedings paper |
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Title: | Examining Food Quality via RFID Tag Array |
Event: | 2021 International Conference on Microwave and Millimeter Wave Technology (ICMMT) |
Dates: | 23 May 2021 - 26 May 2021 |
ISBN-13: | 9781665434379 |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1109/ICMMT52847.2021.9617981 |
Publisher version: | https://doi.org/10.1109/ICMMT52847.2021.9617981 |
Language: | English |
Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions. |
Keywords: | Mutual coupling, Microwave technology, Microwave integrated circuits, Supply chains, RF signals, Millimeter wave technology, Safety |
UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
URI: | https://discovery.ucl.ac.uk/id/eprint/10173176 |




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