Doherty, Adam; (2023) X-ray Dark-Field Imaging Techniques. Doctoral thesis (Ph.D), UCL (University College London).

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Abstract

X-ray dark-field imaging is a non-destructive inspection modality for the investigation of a sample’s microstructure beyond the limits imposed by the imaging system’s spatial resolution. Dark-field contrast is generated by elastic scattering from micron-scale inhomogeneities within a sample, highlighting features that cannot be resolved through conventional x-ray attenuation. This thesis outlines dark-field imaging techniques compatible with the compact, laboratory-based, edge-illumination x-ray imaging system. These techniques provide additional information, with respect to conventional x-ray imaging setups, for the inspection of a wider range of samples without the need for coherent radiation or a high-resolution system. X-ray dark-field tomography is presented for the three-dimensional reconstruction of the linear scattering coefficient within a volume, showing improved contrast and sharpness over the attenuation reconstructions. Directional dark field is outlined for the mapping of the orientation of ordered structures within a two-dimensional image, which can highlight damage within composite materials. These are then followed by the introduction of single-shot dark-field imaging, which reduces the dimensionality of dark-field data acquisition by overcoming the necessity of scanning optical components. This approach is applied to dark-field tomography and to directional dark-field imaging. Finally, this is discussed as a possible approach to simplify x-ray tensor tomography, which combines tomography and directional dark-field imaging to reconstruct anisotropic structures in three dimensions.

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