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X-ray dark-field tomography using edge-illumination

Doherty, Adam; Savidis, Savvis; Astolfo, Alberto; Massimi, Lorenzo; Djurabekova, Nargiza; Navarrete Leon, Carlos; Gerli, Mattia; ... Endrizzi, Marco; + view all (2022) X-ray dark-field tomography using edge-illumination. In: Proceedings of SPIE: Developments in X-Ray Tomography XIV. (pp. pp. 1-6). Society of Photo-Optical Instrumentation Engineers (SPIE) Green open access

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Abstract

X-ray dark-field imaging is used to visualize the ultra-small angle x-ray scattering signal that originates from sub-resolution density fluctuations within the sample microstructure. Dark-field tomography using the edge-illumination x-ray imaging system is presented as a tool for measuring this scattering signal in a sample in three dimensions. Its applicability to different fields is shown through example images of a multi-material phantom, a tissue-engineered esophagus, a pouch cell battery and a short-fiber reinforced composite material. The multichannel contrast available in edge-illumination helps with material identification, with high contrast at boundaries enhancing dark-field reconstructions.

Type: Proceedings paper
Title: X-ray dark-field tomography using edge-illumination
Event: Developments in X-Ray Tomography XIV
Location: San Diego, California, USA
Dates: 21st-26th August 2022
Open access status: An open access version is available from UCL Discovery
DOI: 10.1117/12.2632731
Publisher version: https://doi.org/10.1117/12.2632731
Language: English
Additional information: This version is the version of record. For information on re-use, please refer to the publisher's terms and conditions.
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/10164507
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