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Single-Exposure, Single-Mask, Edge-Illumination X-ray Phase-Contrast Imaging Using a 7.8-μm Pixel Pitch Direct Conversion X-ray Detector

Pil-Ali, A; Adnani, S; Scott, CC; Olivo, A; Karim, KS; (2022) Single-Exposure, Single-Mask, Edge-Illumination X-ray Phase-Contrast Imaging Using a 7.8-μm Pixel Pitch Direct Conversion X-ray Detector. In: 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2021 and 28th International Symposium on Room-Temperature Semiconductor Detectors, RTSD 2022. IEEE: Piscataway, NJ, USA. Green open access

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Abstract

Double-mask edge-illumination is a well-reported technique for phase-contrast x-ray imaging. Although phase retrieval using this technique is comparably easier than propagation-based phase-contrast x-ray imaging, edge-illumination can be inefficient in terms of dose efficiency and imaging time when it comes to computed tomography scanning. The illumination curve, which describes the beamlets' intensity profile impinging upon the detector, is a key parameter that contributes to retrieving phase and absorption information. To obtain the illumination curve, multiple exposures are typically required which decreases x-ray dose efficiency and, more importantly, increases imaging time. Moreover, sample motion can negatively impact the image and information retrieval process. In this research, we employ a single mask in conjunction with a 7.8-μm pixel pitch amorphous selenium-CMOS hybrid direct conversion x-ray detector to obtain the beamlets' intensity profile with only a single exposure. We demonstrate how using an ultra-high spatial resolution x-ray detector with a single-mask edge-illumination technique can potentially increase both dose efficiency and imaging time by at least a factor of 1.5X. Moreover, the resulting system using our approach is more compact with a source-to-detector distance of less than 30 cm. Single-exposure imaging can also help mitigate the impact of motion artifacts in the final image.

Type: Proceedings paper
Title: Single-Exposure, Single-Mask, Edge-Illumination X-ray Phase-Contrast Imaging Using a 7.8-μm Pixel Pitch Direct Conversion X-ray Detector
Event: 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Dates: 16 Oct 2021 - 23 Oct 2021
ISBN-13: 9781665421133
Open access status: An open access version is available from UCL Discovery
DOI: 10.1109/NSS/MIC44867.2021.9875866
Publisher version: https://doi.org/10.1109/NSS/MIC44867.2021.9875866
Language: English
Additional information: This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions.
Keywords: X-ray imaging, Phase-Contrast X-ray Imaging, Edge-Illumination, Coded-Aperture, Illumination Curve, SingleExposure, Dose-Efficient, Motion Artifact, Amorphous Selenium (a-Se), CMOS X-ray Detector, High-Resolution Imaging
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/10161206
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