Wieditz, J;
Pokern, Y;
Schuhmacher, D;
Huckemann, S;
(2021)
Characteristic and necessary minutiae in fingerprints.
Journal of The Royal Statistical Society Series C - Applied Statistics
10.1111/rssc.12520.
(In press).
Preview |
Text
rssc.12520.pdf - Published Version Download (2MB) | Preview |
Abstract
Fingerprints feature a ridge pattern with moderately varying ridge frequency (RF), following an orientation field (OF), which usually features some singularities. Additionally at some points, called minutiae, ridge lines end or fork and this point pattern is usually used for fingerprint identification and authentication. Whenever the OF features divergent ridge lines (e.g., near singularities), a nearly constant RF necessitates the generation of more ridge lines, originating at minutiae. We call these the necessary minutiae. It turns out that fingerprints feature additional minutiae which occur at rather arbitrary locations. We call these the random minutiae or, since they may convey fingerprint individuality beyond the OF, the characteristic minutiae. In consequence, the minutiae point pattern is assumed to be a realization of the superposition of two stochastic point processes: a Strauss point process (whose activity function is given by the divergence field) with an additional hard core, and a homogeneous Poisson point process, modelling the necessary and the characteristic minutiae, respectively. We perform Bayesian inference using an Markov-Chain-Monte-Carlo (MCMC)-based minutiae separating algorithm (MiSeal). In simulations, it provides good mixing and good estimation of underlying parameters. In application to fingerprints, we can separate the two minutiae patterns and verify by example of two different prints with similar OF that characteristic minutiae convey fingerprint individuality.
Type: | Article |
---|---|
Title: | Characteristic and necessary minutiae in fingerprints |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1111/rssc.12520 |
Publisher version: | https://doi.org/10.1111/rssc.12520 |
Language: | English |
Additional information: | This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
Keywords: | Science & Technology, Physical Sciences, Statistics & Probability, Mathematics, Bayesian inference, biometrics, classification, divergence, Markov Chain Monte Carlo, parameter estimation, spatial point processes, GIBBS, SUPERPOSITIONS, CLASSIFICATION, APPROXIMATION, INTENSITY, POINTS |
UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Statistical Science |
URI: | https://discovery.ucl.ac.uk/id/eprint/10134421 |
Archive Staff Only
View Item |