Parkinson, P;
Alanis, JA;
Skalsky, S;
Zhang, Y;
Liu, H;
Lysevych, M;
Tan, HH;
(2020)
A needle in a needlestack: exploiting functional inhomogeneity for optimized nanowire lasing.
In: Huffaker, DL and Eisele, H, (eds.)
Quantum Dots, Nanostructures, and Quantum Materials: Growth, Characterization, and Modeling XVII.
SPIE: San Francisco, CA, USA.
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Abstract
III-V semiconductor nanowires allow easy hetero-integration of optoelectronic components onto silicon due to efficient strain relaxation, well-understood design approaches and scalability. However continuous room temperature lasing has proven elusive. A key challenge is performing repeatable single-wire characterization { each wire can be different due to local growth conditions present during bottom-up growth. Here, we describe an approach using large-scale population studies which exploit inherent inhomogeneity to understand the complex interplay of geometric design, crystal structure, and material quality. By correlating nanowire length with threshold for hundreds of nanowire lasers, this technique reveals core-reabsorption as the critical limiting process in multiple-quantum-well nanowire lasers. By incorporating higher band-gap nanowire core, this effect is eliminated, providing reflectivity dominated behavior.
| Type: | Proceedings paper |
|---|---|
| Title: | A needle in a needlestack: exploiting functional inhomogeneity for optimized nanowire lasing |
| Event: | SPIE OPTO, 2020 |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1117/12.2558405 |
| Publisher version: | https://doi.org/10.1117/12.2558405 |
| Language: | English |
| Additional information: | This version is the version of record. For information on re-use, please refer to the publisher’s terms and conditions. |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10097351 |
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