Shutts, S;
Allford, CP;
Spinnler, C;
Li, Z;
Sobiesierski, A;
Tang, M;
Liu, H;
(2019)
Degradation of III–V Quantum Dot Lasers Grown Directly on Silicon Substrates.
IEEE Journal of Selected Topics in Quantum Electronics
, 25
(6)
, Article 1900406. 10.1109/JSTQE.2019.2915994.
Preview |
Text
Shutts_08712344.pdf - Published Version Download (908kB) | Preview |
Abstract
Initial age-related degradation mechanisms for InAs quantum dot lasers grown on silicon substrates emitting at 1.3 μm are investigated. The rate of degradation is observed to increase for devices operated at higher carrier densities and is therefore dependent on gain requirement or cavity length. While carrier localization in quantum dots minimizes degradation, an increase in the number of defects in the early stages of aging can increase the internal optical-loss that can initiate rapid degradation of laser performance due to the rise in threshold carrier density. Population of the two-dimensional states is considered the major factor for determining the rate of degradation, which can be significant for lasers requiring high threshold carrier densities. This is demonstrated by operating lasers of different cavity lengths with a constant current and measuring the change in threshold current at regular intervals. A segmented-contact device, which can be used to measure the modal absorption and also operate as a laser, is used to determine how the internal optical-loss changes in the early stages of degradation. Structures grown on silicon show an increase in internal optical loss, whereas the same structure grown on GaAs shows no signs of increase in internal optical loss when operated under the same conditions.
| Type: | Article |
|---|---|
| Title: | Degradation of III–V Quantum Dot Lasers Grown Directly on Silicon Substrates |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1109/JSTQE.2019.2915994 |
| Publisher version: | https://doi.org/10.1109/JSTQE.2019.2915994 |
| Language: | English |
| Additional information: | This work is licensed under a Creative Commons Attribution 3.0 License. For more information, see http://creativecommons.org/licenses/by/3.0/. |
| Keywords: | Quantum dot lasers, Silicon, Degradation, Temperature measurement, Substrates, Measurement by laser beam, Quantum dots, semiconductor defects, semiconductor laser |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10078628 |
Archive Staff Only
 |
View Item |
