Kataoka, M;
              
      
            
                Giblin, SP;
              
      
            
                Fletcher, JD;
              
      
            
                Johnson, N;
              
      
            
                Humphreys, DA;
              
      
            
                See, P;
              
      
            
                Pepper, M;
              
      
            
            
          
      
            
            
          
      
            
            
          
      
            
            
          
      
            
            
            ... Ritchie, DA; + view all
            
          
      
        
        
        
    
  
(2018)
  Single-Hot-Electron Wave Packets for Quantum Electrical Metrology.
    
    
      In: 
      Proceedings of 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018).
      
      
    
 IEEE: Paris, France.
  
  
      
    
  
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Abstract
Using a recently-developed time-of-flight measurement technique with 1 ps time resolution and electron-energy spectroscopy, we developed a method to measure the longitudinal-optical-phonon emission rate of hot electrons travelling along a depleted edge of a quantum Hall bar. A comparison of the experimental results to a single-particle model implies that the main scattering mechanism involves a two-step process via intra-Landau-level transition. We show this scattering can be suppressed by controlling the edge potential profile, and a scattering length > 1 mm can be achieved, allowing the use of this system for scalable single-electron device applications.
| Type: | Proceedings paper | 
|---|---|
| Title: | Single-Hot-Electron Wave Packets for Quantum Electrical Metrology | 
| Event: | Conference on Precision Electromagnetic Measurements (CPEM) - 2018 | 
| Location: | Paris, FRANCE | 
| Dates: | 08 July 2018 - 13 July 2018 | 
| ISBN-13: | 978-1-5386-0973-6 | 
| Open access status: | An open access version is available from UCL Discovery | 
| DOI: | 10.1109/CPEM.2018.8501246 | 
| Publisher version: | https://doi.org/10.22323/1.330.000110.1109/CPEM.20... | 
| Language: | English | 
| Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions. | 
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology  | 
        
| URI: | https://discovery.ucl.ac.uk/id/eprint/10066084 | 
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