Sala, S;
Daurer, BJ;
Hantke, MF;
Ekeberg, T;
Loh, ND;
Maia, FRNC;
Thibault, P;
(2017)
Ptychographic imaging for the characterization of X-ray free-electron laser beams.
Journal of Physics: Conference Series
, 849
(1)
, Article 012032. 10.1088/1742-6596/849/1/012032.
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Abstract
We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI.
Type: | Article |
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Title: | Ptychographic imaging for the characterization of X-ray free-electron laser beams |
Event: | 13th International X-Ray Microscopy Conference (XRM) |
Location: | Diamond Light Source, Oxford, ENGLAND |
Dates: | 15 August 2016 - 19 August 2016 |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1088/1742-6596/849/1/012032 |
Publisher version: | https://doi.org/10.1088/1742-6596/849/1/012032 |
Language: | English |
Additional information: | © 2017 IOP Publishing. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence (https://creativecommons.org/licenses/by/3.0/). |
UCL classification: | UCL UCL > Provost and Vice Provost Offices UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences |
URI: | https://discovery.ucl.ac.uk/id/eprint/10052345 |
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