Cheng, Y;
Meleco, AJ;
Roeth, AJ;
Whiteside, VR;
Debnath, MC;
Mishima, TD;
Santos, MB;
... Sellers, IR; + view all
(2018)
An Investigation of the Role of Radiative and Nonradiative Recombination Processes in InAs/GaAs 1−x Sb x Quantum Dot Solar Cells.
IEEE Journal of Photovoltaics
, 8
(2)
pp. 487-492.
10.1109/JPHOTOV.2017.2779325.
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Abstract
An InAs/GaAs0.86 Sb 0.14 quantum dot solar cell and a GaAsSb control cell were investigated using temperature-dependent current density–voltage (J–V), external quantum efficiency, photoluminescence (PL), and electroluminescence (EL) measurements. Thermally activated defect states associated with the GaAsSb matrix material are found to account for the reduction of the performance of the solar cell. The rapid quenching of the PL and EL intensity, along with the shift (above 150 K) of the dominant recombination process during spontaneous emission (EL), further indicates the prevalence of nonradiative processes at elevated temperatures in these systems. These findings are also supported by a reduction in the open-circuit voltage at elevated temperatures in these devices.
Type: | Article |
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Title: | An Investigation of the Role of Radiative and Nonradiative Recombination Processes in InAs/GaAs 1−x Sb x Quantum Dot Solar Cells |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1109/JPHOTOV.2017.2779325 |
Publisher version: | https://doi.org/10.1109/JPHOTOV.2017.2779325 |
Language: | English |
Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions. |
Keywords: | Defects, electroluminescence (EL), nonradiative, recombination, Temperature measurement, Gallium arsenide, Photovoltaic cells, Temperature control, Resistance, Quantum dots, Strain |
UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
URI: | https://discovery.ucl.ac.uk/id/eprint/10044900 |




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