Caldwell, M;
Ransley, M;
Rogers, TW;
Griffin, LD;
(2017)
Transferring X-ray based automated threat detection between scanners with different energies and resolution.
In: Bouma, H and Carlysle-Davies, F and Stokes, RJ and Yitzhaky, Y, (eds.)
Counterterrorism, Crime Fighting, Forensics and Surveillance Technologies.
(pp. 104410F:1-104410F:10).
Society of Photo-Optical Instrumentation Engineers (SPIE): Bellingham, Washington, USA.
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Abstract
A significant obstacle to developing high performance Deep Learning algorithms for Automated Threat Detection (ATD) in security X-ray imagery, is the difficulty of obtaining large training datasets. In our previous work, we circumvented this problem for ATD in cargo containers, using Threat Image Projection and data augmentation. In this work, we investigate whether data scarcity for other modalities, such as parcels and baggage, can be ameliorated by transforming data from one domain so that it approximates the appearance of another. We present an ontology of ATD datasets to assess where transfer learning may be applied. We define frameworks for transfer at the training and testing stages, and compare the results for both methods against ATD where a common data source is used for training and testing. Our results show very poor transfer, which we attribute to the difficulty of accurately matching the blur and contrast characteristics of different scanners.
Type: | Proceedings paper |
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Title: | Transferring X-ray based automated threat detection between scanners with different energies and resolution |
Event: | SPIE Security + Defence 2017, 11-14 September 2017, Warsaw, Poland |
Location: | Warsaw, POLAND |
Dates: | 11 September 2017 - 12 September 2017 |
ISBN-13: | 9781510613461 |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1117/12.2277641 |
Publisher version: | http://dx.doi.org/10.1117/12.2277641 |
Language: | English |
Additional information: | This is the published version of record. For information on re-use, please refer to the publisher’s terms and conditions. |
Keywords: | Deep Learning, X-ray imaging, Automated Threat Detection, Transfer Learning |
UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Computer Science |
URI: | https://discovery.ucl.ac.uk/id/eprint/10041415 |
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