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Feasibility Study of Time-of-Flight Compton Scatter Imaging Using Picosecond Length X-Ray Pulses

Calvert, N; Betcke, MM; Deacon, AN; Gleeson, AJ; Hill, C; McIntosh, PA; Mitchell, LO; ... Speller, RD; + view all (2014) Feasibility Study of Time-of-Flight Compton Scatter Imaging Using Picosecond Length X-Ray Pulses. IEEE TRANSACTIONS ON NUCLEAR SCIENCE , 61 (6) pp. 3701-3710. 10.1109/TNS.2014.2367239. Green open access

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Abstract

By measuring the time of flight of scattered X-ray photons, the point of interaction, assuming a single scatter, can be determined, providing 3-D information about an object under inspection. This paper describes experimental ToF Compton scatter measurements conducted at the versatile electron linear accelerator (VELA), a picosecond pulsewidth electron source situated in Daresbury, U.K. The ToF of scattered X-ray photons was measured using a CeBr3 detector, and a full width at half maximum (FWHM) of between 29 and 36 cm was achieved with a 5-cm-thick plastic test object. By implementing a low-energy cutoff, the FWHM was reduced to between 12 and 26 cm. Two test objects placed in series with a 50-cm space between were separable in the data after applying the low energy cutoff.

Type: Article
Title: Feasibility Study of Time-of-Flight Compton Scatter Imaging Using Picosecond Length X-Ray Pulses
Open access status: An open access version is available from UCL Discovery
DOI: 10.1109/TNS.2014.2367239
Publisher version: http://dx.doi.org10.1109/TNS.2014.2367239
Language: English
Additional information: “© © 20xx IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.” Authors and/or their employers shall have the right to post the accepted version of IEEE-copyrighted articles on their own personal servers or the servers of their institutions or employers without permission from IEEE, provided that the posted version includes a prominently displayed IEEE copyright notice (as shown in 8.1.9.B, above) and, when published, a full citation to the original IEEE publication, including a Digital Object Identifier (DOI). Authors shall not post the final, published versions of their articles.
Keywords: Cargo security, time of flight (ToF), X-ray scattering
UCL classification: UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Computer Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Security and Crime Science
URI: https://discovery.ucl.ac.uk/id/eprint/1468797
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