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Optimization of overlap uniformness for ptychography

Huang, X; Yan, H; Harder, R; Hwu, Y; Robinson, IK; Chu, YS; (2014) Optimization of overlap uniformness for ptychography. Optics Express , 22 (10) pp. 12634-12644. 10.1364/OE.22.012634. Green open access

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Abstract

We demonstrate the advantages of imaging with ptychography scans that follow a Fermat spiral trajectory. This scan pattern provides a more uniform coverage and a higher overlap ratio with the same number of scan points over the same area than the presently used mesh and concentric [13] patterns. Under realistically imperfect measurement conditions, numerical simulations show that the quality of the reconstructed image is improved significantly with a Fermat spiral compared with a concentric scan pattern. The result is confirmed by the performance enhancement with experimental data, especially under low-overlap conditions. These results suggest that the Fermat spiral pattern increases the quality of the reconstructed image and tolerance to data with imperfections.

Type: Article
Title: Optimization of overlap uniformness for ptychography
Location: United States
Open access status: An open access version is available from UCL Discovery
DOI: 10.1364/OE.22.012634
Publisher version: http://dx.doi.org/10.1364/OE.22.012634
Language: English
Additional information: Copyright © 2014 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: https://discovery.ucl.ac.uk/id/eprint/1433922
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