Huang, X;
Yan, H;
Harder, R;
Hwu, Y;
Robinson, IK;
Chu, YS;
(2014)
Optimization of overlap uniformness for ptychography.
Optics Express
, 22
(10)
pp. 12634-12644.
10.1364/OE.22.012634.
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Abstract
We demonstrate the advantages of imaging with ptychography scans that follow a Fermat spiral trajectory. This scan pattern provides a more uniform coverage and a higher overlap ratio with the same number of scan points over the same area than the presently used mesh and concentric [13] patterns. Under realistically imperfect measurement conditions, numerical simulations show that the quality of the reconstructed image is improved significantly with a Fermat spiral compared with a concentric scan pattern. The result is confirmed by the performance enhancement with experimental data, especially under low-overlap conditions. These results suggest that the Fermat spiral pattern increases the quality of the reconstructed image and tolerance to data with imperfections.
| Type: | Article |
|---|---|
| Title: | Optimization of overlap uniformness for ptychography |
| Location: | United States |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1364/OE.22.012634 |
| Publisher version: | http://dx.doi.org/10.1364/OE.22.012634 |
| Language: | English |
| Additional information: | Copyright © 2014 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited. |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1433922 |
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