Burdet, N;
Morrison, GR;
Huang, X;
Shi, X;
Clark, JN;
Zhang, F;
Civita, M;
... Robinson, IK; + view all
(2014)
Observations of artefacts in the x-ray ptychography method.
Optics Express
, 22
(9)
10294 - 10303.
10.1364/OE.22.010294.
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Abstract
X-ray ptychography, a scanning coherent diffraction imaging method, was used to reconstruct images of a “Siemens star” test pattern with amplitude and phase contrast. While studying how the use of illumination with an increased bandwidth results in clear improvements in the quality of image reconstructions, we found that an artificial change in the overall distance scale factor of the algorithm leads to a systematic response in the image, which is reproduced with an incorrect number of spokes. This pathology is explained by the conflict between the length scales set by the scan and by the diffraction patterns on the detector.
| Type: | Article |
|---|---|
| Title: | Observations of artefacts in the x-ray ptychography method |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1364/OE.22.010294 |
| Publisher version: | http://dx.doi.org/10.1364/OE.22.010294 |
| Language: | English |
| Additional information: | Copyright © 2014 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited. |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1431323 |
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