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Resonance-Enhanced Terahertz Nanoscopy Probes

Siday, T; Hale, LL; Hermans, RI; Mitrofanov, O; (2020) Resonance-Enhanced Terahertz Nanoscopy Probes. ACS Photonics , 7 (3) pp. 596-601. 10.1021/acsphotonics.9b01766. Green open access

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Abstract

Near-field nanoscopy at terahertz (THz) frequencies is uniquely placed to probe a multitude of physical phenomena at the nanoscale. However, at THz frequencies, the scattering efficiency of standard near-field probes is poor, limiting the sensitivity and, hence, resolution of the technique. Here, we propose and demonstrate tunable resonant scattering from metal tips that allow us to overcome this limitation. Tips supporting a λ/2 dipolar resonance in the THz range are fabricated from indium metal directly on the tine of a quartz tuning fork. We observe enhancement of the THz scattering efficiency at the resonance frequency with a Q-factor of ∼2–3. These tips enable a subwavelength spatial resolution better than 100 nm. We support the experimentally observed enhancement using a numerical model. The enhanced scattering efficiency afforded by the resonant indium tips can enable the probing of new phenomena, such as plasmons in two-dimensional materials, that have proven difficult to observe thus far.

Type: Article
Title: Resonance-Enhanced Terahertz Nanoscopy Probes
Open access status: An open access version is available from UCL Discovery
DOI: 10.1021/acsphotonics.9b01766
Publisher version: https://doi.org/10.1021/acsphotonics.9b01766
Language: English
Additional information: This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions.
Keywords: Near-field microscopy s-SNOM nanospectroscopy resonant scattering
UCL classification: UCL
UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/10093322
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