Martin, CP;
Blunt, MO;
Pauliac-Vaujour, E;
Stannard, A;
Moriarty, P;
Vancea, I;
Thiele, U;
(2007)
Controlling pattern formation in nanoparticle assemblies via directed solvent dewetting.
Phys Rev Lett
, 99
(11)
, Article 116103. 10.1103/PhysRevLett.99.116103.
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Abstract
We have achieved highly localized control of pattern formation in two-dimensional nanoparticle assemblies by direct modification of solvent dewetting dynamics. A striking dependence of nanoparticle organization on the size of atomic force microscope-generated surface heterogeneities is observed and reproduced in numerical simulations. Nanoscale features induce a rupture of the solvent-nanoparticle film, causing the local flow of solvent to carry nanoparticles into confinement. Microscale heterogeneities instead slow the evaporation of the solvent, producing a remarkably abrupt interface between different nanoparticle patterns.
| Type: | Article |
|---|---|
| Title: | Controlling pattern formation in nanoparticle assemblies via directed solvent dewetting. |
| Location: | United States |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1103/PhysRevLett.99.116103 |
| Publisher version: | http://dx.doi.org/10.1103/PhysRevLett.99.116103 |
| Language: | English |
| Additional information: | © 2007 The American Physical Society |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Chemistry |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1384938 |
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