Browse by UCL people
Group by: Type | Date
Number of items: 5.
Article
Cerbu, F;
Madia, O;
Andreev, DV;
Fadida, S;
Eizenberg, M;
Breuil, L;
Lisoni, JG;
... Stesmans, A; + view all
(2016)
Intrinsic electron traps in atomic-layer deposited HfO2 insulators.
Applied Physics Letters
, 108
(22)
, Article 222901. 10.1063/1.4952718.
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Gao, D;
Strand, J;
Munde, M;
Shluger, A;
(2019)
Mechanisms of Oxygen Vacancy Aggregation in SiO2 and HfO2.
Frontiers in Physics
, 7
, Article 43. 10.3389/fphy.2019.00043.
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Kaviani, M;
Strand, J;
Afanas'ev, VV;
Shluger, AL;
(2016)
Deep electron and hole polarons and bipolarons in amorphous oxide.
PHYSICAL REVIEW B
, 94
(2)
, Article 020103(R). 10.1103/PhysRevB.94.020103.
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Strand, JW;
Kaviani, M;
Afanas’ev, VV;
Lisoni, JG;
Shluger, AL;
(2018)
Intrinsic electron trapping in amorphous oxide.
Nanotechnology
, 29
(12)
, Article 125703. 10.1088/1361-6528/aaa77a.
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Thesis
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Strand, Jack William;
(2019)
Structure and mechanisms of formation of point defects in HfO₂, MgO and hexagonal boron nitride.
Doctoral thesis (Eng.D), UCL (University College London).
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