Bailey, JJ;
Heenan, TMM;
Finegan, DP;
Lu, X;
Daemi, SR;
Iacoviello, F;
Backeberg, NR;
... Shearing, PR; + view all
(2017)
Laser-preparation of geometrically optimised samples for X-ray nano-CT.
Journal of Microscopy
, 267
(3)
pp. 384-396.
10.1111/jmi.12577.
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Abstract
A robust and versatile sample preparation technique for the fabrication of cylindrical pillars for imaging by X-ray nano-computed tomography (nano-CT) is presented. The procedure employs simple, cost-effective laser micro-machining coupled with focused-ion beam (FIB) milling, when required, to yield mechanically robust samples at the micrometre length-scale to match the field-of-view (FOV) for nano-CT imaging. A variety of energy and geological materials are exhibited as case studies, demonstrating the procedure can be applied to a variety of materials to provide geometrically optimised samples whose size and shape are tailored to the attenuation coefficients of the constituent phases. The procedure can be implemented for the bespoke preparation of pillars for both lab- and synchrotron-based X-ray nano-CT investigations of a wide range of samples.
| Type: | Article |
|---|---|
| Title: | Laser-preparation of geometrically optimised samples for X-ray nano-CT |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1111/jmi.12577 |
| Publisher version: | http://doi.org/10.1111/jmi.12577 |
| Language: | English |
| Additional information: | This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
| Keywords: | Laser micro-machining;lithium-ion batteries;sample preparation;shale;solid oxide fuel cells;X-ray tomography |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Chemical Engineering UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1559044 |
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