Warburton, PA;
Fenton, JC;
Korsah, M;
Grovenor, CRM;
(2006)
Josephson current suppression in three-dimensional focused-ion-beam fabricated sub-micron intrinsic junctions.
Superconductor Science and Technology
, 19
(5)
S187 - S190.
10.1088/0953-2048/19/5/S04.
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Abstract
We have fabricated intrinsic Josephson junction arrays in Tl2Ba2CaCu2O8 thin films using three-dimensional focused-ion-beam milling. We have measured the dependence of the switching current density of these arrays at 4.2 K upon the junction cross-sectional area. There is strong suppression of the switching current density for junctions of area less than 1 mu m(2), the current extrapolating to zero at an area of 0.25 mu m(2). We discuss the possible roles of gallium ion implantation and both thermal and quantum fluctuations in this current suppression.
| Type: | Article |
|---|---|
| Title: | Josephson current suppression in three-dimensional focused-ion-beam fabricated sub-micron intrinsic junctions |
| Location: | Noordwijkerhout, NETHERLANDS |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1088/0953-2048/19/5/S04 |
| Publisher version: | http://dx.doi.org/10.1088/0953-2048/19/5/S04 |
| Language: | English |
| Additional information: | © 2006 IOP Publishing Ltd |
| Keywords: | ARRAYS |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
| URI: | https://discovery.ucl.ac.uk/id/eprint/152959 |
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