Kenyon, AJ;
Trwoga, PF;
Pitt, CW;
Rehm, G;
(1998)
Luminescence efficiency measurements of silicon nanoclusters.
Applied Physics Letters
, 73
(4)
523 - 525.
10.1063/1.121921.
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Abstract
We present the results of what we believe to be the first study of the power efficiency of room temperature photoluminescence from thin films of silica containing silicon nanoclusters. Films were prepared by plasma enhanced chemical vapor deposition from silane and nitrous oxide precursors. Luminescence was excited using the 476 nm line of an argon-ion laser. We have measured power efficiencies for samples that exhibit luminescence solely due to radiative recombination of quantum confined excitons. Efficiencies around 0.04% are reported. (C) 1998 American Institute of Physics.
| Type: | Article |
|---|---|
| Title: | Luminescence efficiency measurements of silicon nanoclusters |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1063/1.121921 |
| Publisher version: | http://dx.doi.org/10.1063/1.121921 |
| Language: | English |
| Additional information: | Copyright 1998 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Kenyon, AJ and Trwoga, PF and Pitt, CW and Rehm, G (1998) Luminescence efficiency measurements of silicon nanoclusters. Applied Physics Letters, 73 (4) 523 – 525 and may be found at http://link.aip.org/link/?apl/73/00523 |
| Keywords: | THIN-FILMS, LIGHT-EMISSION, RICH SILICA, SI, ELECTROLUMINESCENCE, PHOTOLUMINESCENCE |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/149922 |
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