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Light Extraction From Scintillating Crystals Enhanced by Photonic Crystal Structures Patterned by Focused Ion Beam

Modrzynski, P; Gotszalk, T; Knapitsch, A; Kunicki, P; Lecoq, P; Moczala, M; Papakonstantinou, I; (2016) Light Extraction From Scintillating Crystals Enhanced by Photonic Crystal Structures Patterned by Focused Ion Beam. IEEE Transactions on Nuclear Science , 63 (2) pp. 644-648. 10.1109/TNS.2015.2494368. Green open access

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Abstract

“Photonic Crystals (PhC)” have been used in a variety of fields as a structure for improving the light extraction efficiency from materials with high index of refraction. In previous work we already showed the light extraction improvement of several PhC covered LYSO crystals in computer simulations and practical measurements. In this work, new samples are made using different materials and techniques which allows further efficiency improvements. For rapid prototyping of PhC patterns on scintillators we tested a new method using “Focused Ion Beam (FIB)” patterning. The FIB machine is a device similar to a “Scanning Electron Microscope (SEM)”, but it uses ions (mainly gallium) instead of electrons for the imaging of the samples' surface. The additional feature of FIB devices is the option of surface patterning in nano-scale which was exploited for our samples. Three samples using FIB patterning have been produced. One of them is a direct patterning of the extraction face of a 0.8×0.8×10 mm3 LYSO crystal. The second and third were TiO2 coated LYSO crystal with a 1.4×1.4 mm2 out coupling face partly covered with high-quality photonic crystals. TiO2 has high refractive index (around 2.1 - 2.4)-which shows the best results in our light extraction simulations. In this paper, SEM images of the samples will be presented together with measurements of excited crystals which show unrivalled performance for such scintillator samples.

Type: Article
Title: Light Extraction From Scintillating Crystals Enhanced by Photonic Crystal Structures Patterned by Focused Ion Beam
Open access status: An open access version is available from UCL Discovery
DOI: 10.1109/TNS.2015.2494368
Publisher version: http://dx.doi.org/10.1109/TNS.2015.2494368
Language: English
Additional information: © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.")
Keywords: Science & Technology, Technology, Engineering, Electrical & Electronic, Nuclear Science & Technology, Engineering, Focused ion beam (FIB), light extraction, LYSO, nanopatterning, nanophotonics, nanostructured materials, photonic crystals, scintillating crystals, scintillators, membranes
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/1495600
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