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Near-Field Analysis of Terahertz Pulse Generation From Photo-Excited Charge Density Gradients

Mueckstein, R; Natrella, M; Hatem, O; Freeman, JR; Graham, CS; Renaud, CC; Seeds, AJ; ... Mitrofanov, O; + view all (2015) Near-Field Analysis of Terahertz Pulse Generation From Photo-Excited Charge Density Gradients. IEEE Transactions on Terahertz Science and Technology , 5 (2) 260- 267. 10.1109/TTHZ.2015.2395389. Green open access

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Abstract

Excitation of photo-current transients at semiconductor surfaces by subpicosecond optical pulses gives rise to emission of electromagnetic pulses of terahertz (THz) frequency radiation. To correlate the THz emission with the photo-excited charge density distribution and the photo-current direction, we mapped near-field and far-field distributions of the generated THz waves from GaAs and Fe-doped InGaAs surfaces. The experimental results show that the charge dynamics in the plane of the surface can radiate substantially stronger THz pulses than the charge dynamics in the direction normal to the surface, which is generally regarded as the dominant origin of the emission.

Type: Article
Title: Near-Field Analysis of Terahertz Pulse Generation From Photo-Excited Charge Density Gradients
Open access status: An open access version is available from UCL Discovery
DOI: 10.1109/TTHZ.2015.2395389
Publisher version: http://dx.doi.org/10.1109/TTHZ.2015.2395389
Language: English
Additional information: © 2015 IEEE. Personal use of this material (accepted version) is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/1462923
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