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11 nm hard X-ray focus from a large-aperture multilayer Laue lens

Huang, X; Yan, H; Nazaretski, E; Conley, R; Bouet, N; Zhou, J; Lauer, K; ... Chu, YS; + view all (2013) 11 nm hard X-ray focus from a large-aperture multilayer Laue lens. Scientific Reports , 3 , Article 3562. 10.1038/srep03562. Green open access

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Abstract

The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm. The obtained X-ray wavefront shows excellent agreement with the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures the MLL capable of producing a diffraction-limited focus while offering a sufficient working distance. This achievement opens up opportunities of incorporating a variety of in-situ experiments into ultra high-resolution X-ray microscopy studies.

Type: Article
Title: 11 nm hard X-ray focus from a large-aperture multilayer Laue lens
Location: England
Open access status: An open access version is available from UCL Discovery
DOI: 10.1038/srep03562
Publisher version: http://dx.doi.org/10.1038/srep03562
Language: English
Additional information: This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/.
UCL classification: UCL
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology
URI: https://discovery.ucl.ac.uk/id/eprint/1421770
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