Huang, X;
Yan, H;
Nazaretski, E;
Conley, R;
Bouet, N;
Zhou, J;
Lauer, K;
... Chu, YS; + view all
(2013)
11 nm hard X-ray focus from a large-aperture multilayer Laue lens.
Scientific Reports
, 3
, Article 3562. 10.1038/srep03562.
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Abstract
The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm. The obtained X-ray wavefront shows excellent agreement with the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures the MLL capable of producing a diffraction-limited focus while offering a sufficient working distance. This achievement opens up opportunities of incorporating a variety of in-situ experiments into ultra high-resolution X-ray microscopy studies.
Type: | Article |
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Title: | 11 nm hard X-ray focus from a large-aperture multilayer Laue lens |
Location: | England |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1038/srep03562 |
Publisher version: | http://dx.doi.org/10.1038/srep03562 |
Language: | English |
Additional information: | This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/. |
UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
URI: | https://discovery.ucl.ac.uk/id/eprint/1421770 |




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