Diemoz, PC;
Endrizzi, M;
Bravin, A;
Robinson, IK;
Olivo, A;
(2014)
Sensitivity of edge illumination X-ray phase-contrast imaging.
Philosophical transactions of the Royal Society of London. Series A: Mathematical and physical sciences
, 372
(2010)
, Article 20130128. 10.1098/rsta.2013.0128.
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Abstract
Recently, we developed a theoretical model that can predict the signal-to-noise ratio for edge-like features in phase-contrast images. This model was then applied for the estimation of the sensitivity of three different X-ray phase-contrast techniques: propagation-based imaging, analyser-based imaging and grating interferometry. We show here how the same formalism can be used also in the case of the edge illumination (EI) technique, providing results that are consistent with those of a recently developed method for the estimation of noise in the retrieved refraction image. The new model is then applied to calculate, in the case of a given synchrotron radiation set-up, the optimum positions of the presample aperture and detector edge to maximize the sensitivity. Finally, an example of the extremely high angular resolution achievable with the EI technique is presented.
| Type: | Article |
|---|---|
| Title: | Sensitivity of edge illumination X-ray phase-contrast imaging |
| Event: | ‘Taking X-ray phase contrast imaging into mainstream applications’ and its satellite workshop ‘Real and reciprocal space X-ray imaging’ |
| Location: | Royal Society, London and Buckinghamshire |
| Dates: | 2013-02-11 - 2013-02-14 |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1098/rsta.2013.0128 |
| Publisher version: | http://dx.doi.org/10.1098/rsta.2013.0128 |
| Language: | English |
| Additional information: | © 2014 The Authors. Published by the Royal Society under the terms of the Creative Commons Attribution License http://creativecommons.org/licenses/by/3.0/, which permits unrestricted use, provided the original author and source are credited. |
| Keywords: | X-ray imaging, phase-contrast imaging, signal-to-noise ratio, sensitivity |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Med Phys and Biomedical Eng UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
| URI: | https://discovery.ucl.ac.uk/id/eprint/1418213 |
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