Norimoto, S;
See, P;
Schoinas, N;
Rungger, I;
Boykin II, TO;
Stewart Jr, MD;
Griffiths, JP;
... Kataoka, M; + view all
(2024)
Statistical study and parallelization of multiplexed single-electron sources.
Applied Physics Letters
, 125
(11)
, Article 113501. 10.1063/5.0225998.
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Abstract
Increasing the electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of the elementary charge e and the operation frequency f. While the current scales with the frequency, due to an operation frequency limit for maintaining accurate single-electron transfer, parallelization of single-electron sources is expected to be a more practical solution to increase the generated electric current I=Nef, where N is the number of parallelized devices. One way to parallelize single-electron sources without increasing the complexity in device operation is to use a common gate. Such a scheme will require each device to have the same operation parameters for single-electron transfer. In order to investigate this possibility, we study the statistics for operation gate voltages using single-electron sources embedded in a multiplexer circuit. The multiplexer circuit allows us to measure 64 single-electron sources individually in a single cooldown. We also demonstrate the parallelization of three single-electron sources and observe the generated current enhanced by a factor of three.
| Type: | Article |
|---|---|
| Title: | Statistical study and parallelization of multiplexed single-electron sources |
| DOI: | 10.1063/5.0225998 |
| Publisher version: | http://dx.doi.org/10.1063/5.0225998 |
| Language: | English |
| Additional information: | This version is the version of record. For information on re-use, please refer to the publisher’s terms and conditions. |
| Keywords: | Physical Sciences, Physics, Physics, Applied, Science & Technology |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10197765 |
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