Isaacs, MA;
Drivas, C;
Lee, R;
Palgrave, R;
Parlett, CMA;
Morgan, DJ;
(2023)
XPS surface analysis of ceria-based materials: Experimental methods and considerations.
Applied Surface Science Advances
, 18
, Article 100469. 10.1016/j.apsadv.2023.100469.
Preview |
PDF
1-s2.0-S2666523923001034-main.pdf - Published Version Download (3MB) | Preview |
Abstract
X-ray photoelectron spectroscopy (XPS) analysis of cerium is ubiquitous amongst the catalytic and materials literature however errors in experimental procedure and data analysis are often easily proliferated. In this work we focus on the best practice for experimental construction when approaching the task of understanding chemical environments in cerium-based materials by XPS.
| Type: | Article |
|---|---|
| Title: | XPS surface analysis of ceria-based materials: Experimental methods and considerations |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1016/j.apsadv.2023.100469 |
| Publisher version: | https://doi.org/10.1016/j.apsadv.2023.100469 |
| Language: | English |
| Additional information: | © 2023 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/bync-nd/4.0/). |
| Keywords: | XPS, Cerium, Surface analysis, X-ray Reduction |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Chemistry |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10179725 |
Archive Staff Only
 |
View Item |
