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Band offsets of metal oxide contacts on TlBr radiation detectors

Voyce, Olivia K; Isaacs, Mark A; Harkness-Brennan, Laura J; Veal, Tim D; Judson, Dan S; Motakef, Shariar; Datta, Amlan; (2021) Band offsets of metal oxide contacts on TlBr radiation detectors. Journal of Applied Physics , 130 (17) , Article 175305. 10.1063/5.0063365. Green open access

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Abstract

Metal oxides are investigated as an alternative to metal contacts on thallium bromide (TlBr) radiation detectors. X-ray photoelectron spectroscopy studies of SnO 2/TlBr and ITO/TlBr devices indicate that a type-II staggered heterojunction forms between TlBr and metal oxides upon contacting. By using the Kraut method of valence band offset (VBO) determination, the VBOs of SnO 2/TlBr and ITO/TlBr heterojunctions are determined to be 1.05 ± 0.17 and 0.70 ± 0.17 eV, respectively. The corresponding conduction band offsets are then found to be 0.13 ± 0.17 and 0.45 ± 0.17 eV, respectively. The I-V response of symmetric In/SnO 2/TlBr and In/ITO/TlBr planar devices is almost Ohmic with a leakage current of less than 2.5 nA at 100 V.

Type: Article
Title: Band offsets of metal oxide contacts on TlBr radiation detectors
Open access status: An open access version is available from UCL Discovery
DOI: 10.1063/5.0063365
Publisher version: https://doi.org/10.1063/5.0063365
Language: English
Additional information: © 2021 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). https://doi.org/10.1063/5.0063365
Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, X-RAY PHOTOEMISSION, SINGLE-CRYSTALS
UCL classification: UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Chemistry
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL
URI: https://discovery.ucl.ac.uk/id/eprint/10146976
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