Isaacs, MA;
Davies-Jones, J;
Davies, PR;
Guan, S;
Lee, R;
Morgan, DJ;
Palgrave, R;
(2021)
Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials.
Materials Chemistry Frontiers
10.1039/d1qm00969a.
(In press).
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Abstract
X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in that it is a ubiquitous tool in the materials community, however as made apparent by recent reviews highlighting it's misuse as a means of chemical deduction, it is a practice which is greatly misunderstood even in its simplest form. Advanced XPS techniques, or a combination of XPS and a complementary surficial probe may elicit auxiliary information outside of the scope of the standard sphere of appreciation. This review aims to bring to the attention of the general materials audience a landscape of some atypical applications of lab-based XPS and combinatorial approaches of related surface analysis, such as ion scattering, ultraviolet photoelectron, electron energy loss and auger emission spectroscopies found on many lab-based instrument set-ups.
| Type: | Article |
|---|---|
| Title: | Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1039/d1qm00969a |
| Publisher version: | https://doi.org/10.1039/D1QM00969A |
| Language: | English |
| Additional information: | © Royal Society of Chemistry 2021. This article is Open Access (http://creativecommons.org/licenses/by/3.0/). |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Chemistry |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10136280 |
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