Constantinou, PC;
Jesson, DE;
(2019)
On the sensitivity of convergent beam low energy electron diffraction patterns to small atomic displacements.
Applied Surface Science
, 489
pp. 504-509.
10.1016/j.apsusc.2019.05.274.
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Abstract
Multiple scattering simulations are developed and applied to assess the potential of convergent beam low-energy electron diffraction (CBLEED) to distinguish between various reconstructions of the Si(001) surface. This is found to be readily achievable through changes in pattern symmetry. A displacement R-factor approach is used to incorporate the angular content of CBLEED discs and identify optimal energy ranges for structure refinement. Defining a disc R-factor, optimal diffraction orders are identified which demonstrate an enhanced sensitivity to small atomic displacements. Using this approach, it was found that respective dimer height and length displacements as small as ±0.06 Å and ±0.20 Å could be detected.
| Type: | Article |
|---|---|
| Title: | On the sensitivity of convergent beam low energy electron diffraction patterns to small atomic displacements |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1016/j.apsusc.2019.05.274 |
| Publisher version: | https://doi.org/10.1016/j.apsusc.2019.05.274 |
| Language: | English |
| Additional information: | © 2019 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by-nc-nd/4.0/). |
| Keywords: | Multiple-scattering low-energy electron diffraction simulation, Convergent-beam low-energy electron diffraction, Si(001), Structure refinement, Surface reconstruction |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences |
| URI: | https://discovery.ucl.ac.uk/id/eprint/10128044 |
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