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Dark Current Analysis of Mid-Wave Quantum Dots-in-a-Well Photodetectors Monolithically Grown on Silicon Substrate

Chen, W; Deng, Z; Huang, J; Chen, B; Liu, H; Wu, J; (2018) Dark Current Analysis of Mid-Wave Quantum Dots-in-a-Well Photodetectors Monolithically Grown on Silicon Substrate. In: He, Jianjun and Dong, Xinyong and Shum Ping, Perry, (eds.) Proceedings of the 2018 Asia Communications and Photonics Conference (ACP 2018). IEEE Xplore: New York, USA. Green open access

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Abstract

In this work, we analyze the dark current performance of the InAs/InGaAs/GaAs quantum dots-in-a-well (DWELL) mid-wave infrared photodetectors monolithically grown on silicon substrate.

Type: Proceedings paper
Title: Dark Current Analysis of Mid-Wave Quantum Dots-in-a-Well Photodetectors Monolithically Grown on Silicon Substrate
Event: 2018 Asia Communications and Photonics Conference (ACP 2018), 26-29 October 2019, Hangzhou, China
ISBN-13: 978153866158-1
Open access status: An open access version is available from UCL Discovery
DOI: 10.1109/ACP.2018.8595811
Language: English
Additional information: This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions.
Keywords: Dark current, Silicon, Substrates, Fitting, Photodetectors, Quantum dots, Gallium arsenide
UCL classification: UCL
UCL > Provost and Vice Provost Offices
UCL > Provost and Vice Provost Offices > UCL BEAMS
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science
UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Electronic and Electrical Eng
URI: https://discovery.ucl.ac.uk/id/eprint/10081133
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