Wachulak, PW;
Torrisi, A;
Bartnik, A;
Wegrzynski, L;
Fok, T;
Fiedorowicz, H;
(2017)
Nanoscale imaging applications of soft X-ray microscope based on a gas-puff target source.
Journal of Physics: Conference Series
, 849
(1)
, Article 012050. 10.1088/1742-6596/849/1/012050.
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Abstract
A compact microscope based on nitrogen double stream gas puff target soft X-ray source, which emits radiation in the water-window spectral range, at the wavelength of λ = 2.88 nm, is presented. The microscope, employing ellipsoidal grazing incidence condenser and a Fresnel zone plate objective, is capable of capturing images with a 60 nm spatial resolution and exposure time as low as a few seconds. Examples of different applications of the SXR microscopy, and its applicability for various fields of science, are presented and discussed.
Type: | Article |
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Title: | Nanoscale imaging applications of soft X-ray microscope based on a gas-puff target source |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1088/1742-6596/849/1/012050 |
Publisher version: | https://doi.org/10.1088/1742-6596/849/1/012050 |
Language: | English |
Additional information: | Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence (http://creativecommons.org/licenses/by/3.0). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. |
UCL classification: | UCL UCL > Provost and Vice Provost Offices UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science |
URI: | https://discovery.ucl.ac.uk/id/eprint/10024883 |
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