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Unambiguous interpretation of atomically resolved force microscopy images of an insulator

Foster, A.S.; Barth, C.; Shluger, A.L.; Reichling, M.; (2001) Unambiguous interpretation of atomically resolved force microscopy images of an insulator. Physical Review Letters , 86 (11) pp. 2373-2376. 10.1103/PhysRevLett.86.2373. Green open access

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Abstract

The (111) surface of CaF 2 was imaged with dynamic mode scanning force microscopy and modeled using atomistic simulation. Both experiment and theory showed a clear triangular contrast pattern in images, and theory demonstrated that the contrast pattern is due to the interaction of a positive electrostatic potential tip with fluorine ions in the two topmost surface layers. We find a good agreement of position and relative height of scan line features between theory and experiment and thus establish for the first time an unambiguous identification of sublattices of an insulator imaged by force microscopy.

Type: Article
Title: Unambiguous interpretation of atomically resolved force microscopy images of an insulator
Open access status: An open access version is available from UCL Discovery
DOI: 10.1103/PhysRevLett.86.2373
Publisher version: http://dx.doi.org/10.1103/PhysRevLett.86.2373
Language: English
Additional information: © 2001 The American Physical Society
UCL classification: UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Physics and Astronomy
URI: https://discovery.ucl.ac.uk/id/eprint/10012
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